Sec S3c2443x Test B D Driver Apr 2026

During stress runs, the driver logs timestamps to /sys/kernel/debug/sec_testbd/stress_log for offline analysis. | Test | Throughput (DMA) | Latency (Crypto) | Power (mW) | |------|------------------|------------------|------------| | 1 GiB secure copy | 1.84 GB/s | – | 120 | | AES‑256‑ECB (256 MiB) | – | 3.2 µs/KB | 95 | | SHA‑256 (1 GiB) | – | 1.1 µs/KB | 88 | | Stress mode 0 (10 k iter) | 0.9 GB/s (average) | – | 130 |

/* 1. Acquire memory region */ res = platform_get_resource(pdev, IORESOURCE_MEM, 0); testbd->base = devm_ioremap_resource(&pdev->dev, res); if (IS_ERR(testbd->base)) return PTR_ERR(testbd->base); Sec S3c2443x Test B D Driver

struct sec_testbd_dma_desc SEC_TESTBD_DMA_DECRYPT */ ; The driver writes the descriptor into the SMI registers, triggers the transfer, and waits for the completion interrupt. Errors such as address misalignment or length overflow generate -EINVAL . Through SEC_TESTBD_IOCTL_CRYPTO , the user can request a single‑shot operation: During stress runs, the driver logs timestamps to

/* 2. Request IRQ */ ret = devm_request_irq(&pdev->dev, platform_get_irq(pdev, 0), sec_testbd_isr, 0, dev_name(&pdev->dev), testbd); if (ret) return ret; Errors such as address misalignment or length overflow

| Parameter | Meaning | |-----------|---------| | mode | 0 = buffer‑overflow test, 1 = timing jitter, 2 = fault‑injection | | iterations | Number of stress cycles (max 10 000) | | seed | Pseudo‑random seed for pattern generation |

err_unregister: unregister_chrdev_region(dev_num, 1); return ret;

The Sec S3c2443x Test B D Driver is a reference implementation of a low‑level device driver for the Sec S3c2443x series of System‑on‑Chip (SoC) peripherals. It is primarily used in embedded Linux environments to validate the functionality of the “Test B D” hardware block, which provides a programmable interface for secure data handling, cryptographic acceleration, and DMA‑based I/O.